This international school covers many aspects of “combined analysis” using X-rays, neutron and electron scattering, and X-ray fluorescence applied to materials science. The objective is to provide the necessary tools to characterize samples using the combined analysis method and the MAUD software.
The organizing Committee : Stéphanie Gascoin, Daniel Chateigner & Luca Lutterotti
What is the Combined Analysis approach?
Quickly, the Combined Analysis methodology is an approach allowing to extract as maximum information as possible from scattering patterns [preferred orientations (ODF, pole figures), residual stresses (homogenisation models of elastic tensors), microstructures (iso- anisotropic sizes, microstrains, distributions, faults), phase analysis (crystalline or mixtures of crystallines/amorphous), structures, thickness and roughness (specular reflectivity)], x-ray reflectivity and fluorescence. It allows individual algorithms to interact with each other to reach a global minimum for simultaneously all the refined parameters. The Rietveld method serves the core of the methodology, and all is integrated in the user-friendly software MAUD.
Each analysis type will be first described, then integrated in the combined approach, and each day of the workshop will be dedicated to one or two characterisation type (texture, reflectivity …) and to its practice. Mornings will consist of courses, afternoons of practical training on your own computers.
All the materials will be downloadable prior to the workshop.
People working on real materials (time-consuming or hard to elaborate, rare, subjected to change under grinding or impossible to grind, films or multilayers, …), are a priori interested by this workshop.
Personal examples can be brought to Caen, might be measured before or during the workshop.